ACU-01B 3HNA024871-00102 System on a Microcontroller

ACU-01B 3HNA024871-00102

Technical Parameters:

  • User defined tag-based programming for descriptive I/O naming
  • Simple-to-use instructions and Easy math to eliminate complex ladder logic rungs
  • Application tools for quick access to setup, programming, debugging and PAC control
  • Task Manager for quick and easy prioritization of Ladder Logic code
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ACU-01B 3HNA024871-00102 System on a Microcontroller

ACU-01B 3HNA024871-00102 Dielectric breakdown is mainly categorized into the following 3 situations:
(1) electrical breakdown: the voltage added to the dielectric microstructure of the dielectric has been damaged, resulting in a large conduction current and short-circuit at both poles.
(2) thermal breakdown: the dielectric in the long-term work of the heat generated by more than the heat dissipated, so that the thermal collapse of the dielectric, occurring in the high-frequency, high-voltage.

ACU-01B 3HNA024871-00102 dielectric in the electric field for a long time as well as external factors prompted by aging, the phenomenon of significant decline in electrical properties. In the production plant mainly for the first two kinds of breakdown test. Therefore, the DC charge and discharge test device is mainly composed of three parts: DC high-voltage generation circuit, frequency generation and logic control interface circuit, charge and discharge switch circuit.

ACU-01B 3HNA024871-00102 communicates mainly through RS-232, RS-485 and CAN bus protocols, which cannot be directly connected to the Internet, and therefore the system is in a state of isolation from the Internet. These systems widely use low-cost 8-bit microcontrollers, which generally only have RS-232 asynchronous serial communication interfaces, and the communication interface must be modified to access the Internet.