CP451-10 Pressure Monitor

CP451-10

Technical Parameters:

  • CPU with 7 communication ports and LCD display
  • Serial ports for master/slave or custom device connections
  • USB local I/O expansion, Ethernet remote I/O
  • Plenty of discrete and analog I/O modules, display on analog modules
  • Easy drive integration
Categories: ,
Get a quote, please contact me immediately:
Simon Zhang
dcsplcsales@gmail.com
Phone/Whatsapp/Skype/Wechat: +86 133 6590 9307

Description

CP451-10 Pressure Monitor


CP451-10 system in the mechanical parameters set up, the first according to the substrate scribing data for programming, to determine the scribing data, MARK point data, the number of knives used, the pressure of each knife each line, the number of times scribing, etc., the above parameters have a special software for editing. After editing is completed and then through the PC1 input PLC CPU, in the completion of the data editing, the software back to automatically generate a cutting simulation screen to determine the substrate scribing of each step by which a few knives to do, in the completion of this series of work, it is necessary to put the substrate into the trial scribing.

CP451-10 according to the system settings, in the substrate into the start button, the substrate platform will automatically send the substrate to the image processing system under the CCD, in the monitor above the see as shown in Figure 4, in the MARK recognition and the system will have a deviation from the settings, according to the deviation of the system to make up for the system is introduced to make up for the process, as shown in Figure 7, to the first knife, for example, the knife 1 origin X distance D1 from the CCD origin is set to a certain value in the system, and the distance D2 between the knife 1 and the knife 1 origin is generated in the compilation procedure, which is also a certain value.

CP451-10 origin and now the distance between the CCD D3, in the preparation of the programme there is a MARK coordinate value, D3 that is, the substrate’s Xward MARK coordinates, D4 for the MARK point and the knife 1 scratching the substrate the first line of the Xward distance, in an ideal state for a certain value. That is, it can be concluded that D1 + D2 = D3 + D4, of which D1, D2 is a fixed value, assuming that D5 for the CCD to identify the dynamic coordinates of the MARK point, the deviation correction for the △ d, it can be concluded that D5 = D3 ± △ d